| EBSD????????????о??е???? |
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| 引用本文： | 王志奋,李长一,李平和,刘继雄,孙宜强.EBSD????????????о??е????[J].物理测试,2011,29(2):1-4. |
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| 作者姓名： | 王志奋 李长一 李平和 刘继雄 孙宜强 |
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| 作者单位： | ????о?? |
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| 摘 要： | 运用电子背散射衍射(EBSD)和X射线衍射(XRD) 技术对硅钢热轧板的织构在板厚方向的分布进行了研究，并分析了两种织构测量方法的特点。EBSD技术能直观给出板厚方向的微观织构，XRD能得到钢板的宏观统计织构信息，结合两种技术的分析，能更直观更精确的研究不同织构在板厚方向的分布。
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| 关 键 词： | ???????????? ODF ??? |
Application of EBSD in the Research of the Silicon Steel's Texture |
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| WANG Zhi-fen,LI Chang-yi,LI Ping-he,LIU Ji-xiong,SUN Yi-qiang.Application of EBSD in the Research of the Silicon Steel's Texture[J].Physics Examination and Testing,2011,29(2):1-4. |
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| Authors: | WANG Zhi-fen LI Chang-yi LI Ping-he LIU Ji-xiong SUN Yi-qiang |
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| Affiliation: | WANG Zhi-fen,LI Chang-yi,LI Ping-he,LIU Ji-xiong,SUN Yi-qiang(Research and Development Center,Wuhan Iron and Steel (Group) Corporation,Wuhan 430080,Hubei,China) |
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| Abstract: | The texture distribution along the thickness of the silicon steel has been investigated by electron backscatter diffraction(EBSD) and X-ray diffraction(XRD) technique.The characteristics of two technique of texture analysis have been investigated.Combined the two techniques,the texture distribution along the thickness of the silicon steel could be realized distinctly and accurately. |
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| Keywords: | electron backscatter diffraction ODF texture |
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