An Internal Pattern Run‐Length Methodology for Slice Encoding

A simple and effective compression method is proposed for multiple‐scan testing. For a given test set, each test pattern is compressed from the view of slices. An encoding table exploiting seven types of frequently‐occurring pattern is used. Compression is then achieved by mapping slice data into codewords. The decompression logic is small and easy to implement. It is also applicable to schemes adopting a single‐scan chain. Experimental results show this method can achieve good compression effect.