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Progress in MOS-controlled bipolar devices and edge termination technologies
Authors:E.M. Sankara Narayanan  O. Spulber  M. Sweet  J.V.S.C. Bose  K. Verchinine  N. Luther-King  N. Moguilnaia  M.M. De Souza
Affiliation:Emerging Technologies Research Centre, De Montfort University, The Gateway, Leicester LE1 9BH, UK
Abstract:
An overview of the recent developments in high-voltage power semiconductor MOS-controlled bipolar devices is presented. The Insulated Gate Bipolar Transistor (IGBT) technology is explored from its initial stage up to the latest state-of-the-art developments, in terms of cathode engineering, drift design and anode engineering to highlight the different approaches used for optimisation and the achieved trade-offs. Further, several MOS-gated thyristors, which are aimed to replace the IGBT, are analysed. Moreover, the present paper reviews the various approaches in the fabrication of edge termination used in power device MOS-controlled bipolar devices.
Keywords:Insulated gate bipolar transistor   Semiconductor   Thyristors
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