Progress in MOS-controlled bipolar devices and edge termination technologies |
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Authors: | E.M. Sankara Narayanan O. Spulber M. Sweet J.V.S.C. Bose K. Verchinine N. Luther-King N. Moguilnaia M.M. De Souza |
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Affiliation: | Emerging Technologies Research Centre, De Montfort University, The Gateway, Leicester LE1 9BH, UK |
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Abstract: | ![]() An overview of the recent developments in high-voltage power semiconductor MOS-controlled bipolar devices is presented. The Insulated Gate Bipolar Transistor (IGBT) technology is explored from its initial stage up to the latest state-of-the-art developments, in terms of cathode engineering, drift design and anode engineering to highlight the different approaches used for optimisation and the achieved trade-offs. Further, several MOS-gated thyristors, which are aimed to replace the IGBT, are analysed. Moreover, the present paper reviews the various approaches in the fabrication of edge termination used in power device MOS-controlled bipolar devices. |
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Keywords: | Insulated gate bipolar transistor Semiconductor Thyristors |
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