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主动式相移干涉测试技术及其应用
引用本文:刘中本,山口一郎.主动式相移干涉测试技术及其应用[J].西安工业学院学报,1994,14(3):185-190.
作者姓名:刘中本  山口一郎
作者单位:西安工业学院,日本理化学研究所
摘    要:在相移干涉测试技术中,相移量误差会直接影响干涉测试的精度,特别是在有振动和空气扰动的环境下很难得到正确的相移量,因而对干涉仪的使用条件要求较高.本文提出了一种主动式相移干涉测试技术,它在较差使用条件下也能自动给出正确的相移量并在这一瞬间自动采集干涉图像,文中叙述了这一技术的原理、实验结果及其在电子散斑干涉技术中的应用.

关 键 词:相移,主动,干涉,电子散斑

Active phase-shifting interferometric measurement technique and its applications
Liu Zhongben,Ichirou Yamaguchi,Junichi Kato.Active phase-shifting interferometric measurement technique and its applications[J].Journal of Xi'an Institute of Technology,1994,14(3):185-190.
Authors:Liu Zhongben  Ichirou Yamaguchi  Junichi Kato
Affiliation:Liu Zhongben;Ichirou Yamaguchi;Junichi Kato
Abstract:In phase-shifting interferometric measurement techniques,the errors of phase-shift magnitude directly affect the accuracy of the test.Especially in vibration and air distur bance conditions,it is hard to get correct phase-shift magnitude so the conditions of using this interferometry are very severe.An active phase-shifting interferomatric technique is proposed in this paper,which can automatically give out the correct phase-shift magni tude in harsh conditions and automatically sampling the interferometric patterns in a flash.The principle of this technique,the experimental results and its applications in phase-shifting electronic speckle pattern interferometry are described in this peper.
Keywords:phase-shift active interference ESPI
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