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缝丝法强流离子束发射度测量中系统误差的模拟研究
引用本文:邹宇斌,郭之虞. 缝丝法强流离子束发射度测量中系统误差的模拟研究[J]. 核技术, 2004, 27(10): 744-748
作者姓名:邹宇斌  郭之虞
作者单位:北京大学重离子物理研究所,重离子物理教育部重点实验室,北京,100871;北京大学重离子物理研究所,重离子物理教育部重点实验室,北京,100871
基金项目:国家自然科学基金重点项目(19835070)资助
摘    要:
本文分析了缝丝法测量强流离子束发射度时系统误差的主要来源,并用模拟计算的方法研究了不同误差来源所带来的误差大小。对于rms发射度测量,因缝采样、忽略缝宽和丝直径、以及空间电荷效应所引起的系统误差均可忽视,而短缝采样和设置较大的阈值则会引起显著的系统误差。

关 键 词:发射度  测量  缝丝法  系统误差  模拟

Simulating study on systematic errors in measurements of high-current ion beam emittance with slit-wire method
ZOU Yubin GUO Zhiyu. Simulating study on systematic errors in measurements of high-current ion beam emittance with slit-wire method[J]. Nuclear Techniques, 2004, 27(10): 744-748
Authors:ZOU Yubin GUO Zhiyu
Abstract:
The main sources of systematic errors in measurements of high-current ion beam emittance with slit-wire method are discussed. The errors with different sources were estimated by simulating the measuring process. For the measurements of rms emittance, the systematic errors due to sampling by slits, omitting the slit width and wire diameter as well as the space charge effect can be omitted. But the limitation of slit length and selecting a large threshold can cause significant systematic errors.
Keywords:Emittance   Measurements   Slit-wire method   Systematic errors   Simulation
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