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Fitting straight lines to point patterns
Authors:F Murtagh  AE Raftery
Affiliation:Department of Computer Science, University College, Dublin, Republic of Ireland;Department of Statistics, Trinity College, Dublin 2, Republic of Ireland
Abstract:In many types of point patterns, linear features are of greatest interest. A very general algorithm is presented here which determines non-overlapping clusters of points which have large linearity. Given a set of points, the algorithm successively merges pairs of clusters or of points, encompassing in the merging criterion both contiguity and linearity. The algorithm is a generalization of the widely-used Ward's minimum variance hierarchical clustering method. The application of this algorithm is illustrated using examples from the literature in biometrics and in character recognition.
Keywords:Hierarchical clustering  Constrained clustering  Principal components analysis  Karhunen-Loève expansion  Variance  Unsupervised classification
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