| 半导体分立器件的失效分析及预防措施 |
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| 引用本文： | 夏远飞,刘勇. 半导体分立器件的失效分析及预防措施[J]. 中国测试, 2012, 0(6): 87-90 |
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| 作者姓名： | 夏远飞 刘勇 |
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| 作者单位： | 空军第一航空学院 |
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| 摘 要： | 为研究过电应力对半导体分立器件可靠性的影响,以国产ZL20螺栓形整流二极管为例,建立整流二极管基本失效率模型,揭示半导体分立器件性能和可靠性的主要影响因素,提出预防半导体分立器件失效的措施。试验结果表明:给出的ZL20螺栓形整流二极管基本失效率模型反映了其失效规律,可以应用于工程实践。
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| 关 键 词： | 过电应力 失效分析 半导体分立器件 可靠性 模型 |
Failure analysis and preventive measures for semi-conductive separated apparatus |
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| XIA Yuan-fei,LIU Yong. Failure analysis and preventive measures for semi-conductive separated apparatus[J]. CHINA MEASUREMENT & TESTING, 2012, 0(6): 87-90 |
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| Authors: | XIA Yuan-fei LIU Yong |
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| Affiliation: | (The First Aeronautical College of Air Force,Henan Xinyang,464000,China) |
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| Abstract: | In order to understand the effect of electrical overstress to the reliability of semi conductive separated apparatuses,this paper introduced main effective factors on capability and reliability of semi-conductive separated apparatuses by setting up ZL20 bolt-shaped diode as a basic model.It also put forward the measures to prevent invalidation of semi-conductive separated apparatuses.The experimental results show that the basic invalidation rate of model ZL20 bolt shaped diode obey the given invalidation rule,which can be applied to engineering practice. |
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| Keywords: | electrical overstress failure analysis semi-conductive separated apparatus reliability model |
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