首页 | 本学科首页   官方微博 | 高级检索  
     


A Dempster-Shafer approach for recognizing machine features from CAD models
Authors:Qiang JiAuthor Vitae  Michael M. MarefatAuthor Vitae
Affiliation:a Department of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Institute, JEC 6003, Troy, NY 12180-3590, USA
b Department of Electrical and Computer Engineering, University of Arizona, Tucson, AZ 85721, USA
Abstract:
Keywords:Dempster-Shafer theory   Evidential reasoning   Feature extraction   Pattern recognition   Geometric reasoning
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号