Understanding the failure mechanisms of microwave bipolar transistors caused by electrostatic discharge |
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Authors: | Liu Jin Chen Yongguang Tan Zhiliang Yang Jie Zhang Xijun Wang Zhenxing |
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Affiliation: | Institute of Electrostatic and Electromagnetic Protection, Ordnance Engineering College, Shijiazhuang 050003, China |
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Abstract: | Electrostatic discharge(ESD) phenomena involve both electrical and thermal effects,and a direct electrostatic discharge to an electronic device is one of the most severe threats to component reliability.Therefore, the electrical and thermal stability of multifinger microwave bipolar transistors(BJTs) under ESD conditions has been investigated theoretically and experimentally.100 samples have been tested for multiple pulses until a failure occurred.Meanwhile,the distributions of electric field,current densit... |
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Keywords: | microwave BJT ESD failure mechanism accumulation effect |
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