Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203 |
| |
| Xue Yuzhi, Martin A Green. Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203[J]. Journal of Semiconductors, 2003, In Press. Xue Y Z, Martin A G. Optical Electron Spectroscopy and Electronic Properties for Multilayers ofal/Al203[J]. Chin. J. Semicond., 2003, 24(S1): 65.Export: BibTex EndNote |
| |
| Authors: | Xue Yuzhi Martin A Green |
| |
| Affiliation: | Dalian Railway lnstitute, Dalian 116028, China and Photovoltaics Special Research Centre of new South Wales, new South Wales, Australia |
| |
| Abstract: | ![]()
Al/Al203 multilayers with nanometer scale are fabricated by thermal evaporation and natural oxidizationtechniques. The detection of X-ray and photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS) is performed, and the curve ofei (ki ) is got. The properties of the negative resistance for the multilayers are found. |
| |
| Keywords: | multilayers ofal/Al203 electron spectroscopy electronic properties |
|
| 点击此处可从《半导体学报》浏览原始摘要信息 |
|
点击此处可从《半导体学报》下载全文 |
|
