Microwave cavity perturbation technique: Part I: Principles |
| |
Authors: | Olivier Klein Steve Donovan Martin Dressel George Grüner |
| |
Affiliation: | 1. Department of Physics and Solid State Science Center, University of California, Los Angeles, 90024-1547, Los Angeles, California
|
| |
Abstract: | This report reviews the analysis used to extract the complex conductivity of a compound from a microwave cavity perturbation measurement. We intend to present a generalized treatment valid for any spheroidally shaped sample of arbitrary conductivity which is placed at either the electric or magnetic field antinode of the cavity. To begin with, we establish the relationship between the measured parameters and the conductivity for a spherical sample. Next, we extend these results to the case of spheroids; and for the first time, we cover all different configurations that one can possibly use to study an arbitrary conducting sample inside a cavity: in particular, all possible orientations of the sample with respect to the applied field are solved. |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |
|