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Radiation effects on lead silicate glass surfaces
Authors:P. W. Wang  Dr L. P. Zhang  N. Borgen  K. Pannell
Affiliation:(1) Department of Physics, The University of Texas at El Paso, 79968 El Paso, TX, USA;(2) Materials Research Institute, The University of Texas at El Paso, 79968 El Paso, TX, USA;(3) Department of Chemistry, The University of Texas at El Paso, 79968 El Paso, TX, USA;(4) Shanghai institute of optics and fine mechanics, Chinese academy of sciences, P.R. China
Abstract:Radiation-induced changes in the microstructure of lead silicate glass were investigated in situ under Mg Kagr irradiation in an ultra-high vacuum (UHV) environment by X-ray photoelectron spectroscopy (XPS). Lead-oxygen bond breaking resulting in the formation of pure lead was observed. The segregation, growth kinetics and the structural relaxation of the lead, with corresponding changes in the oxygen and silicon on the glass surfaces were studied by measuring the time-dependent changes in concentration, binding energy shifts, and the full width at half maximum. A bimodal distribution of the oxygen XPS signal, caused by bridging and non-bridging oxygens, was found during the relaxation process. All experimental data indicate a reduction of the oxygen concentration, a phase separation of the lead from the glass matrix, and the metallization of the lead occurred during and after the X-ray irradiation.
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