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Estimation of the Fraction Defective in Curtailed Sampling Plans by Attributes |
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| Authors: | A. G. Phatak N. M. Bhatt |
| Affiliation: | Department of Statistics , M. S. University of Baroda , India |
| Abstract: | In this paper we have obtained the maximum likelihood estimate of the fraction defective (p) under three different sampling plans. Plan 1 considers complete inspection of the sample, Plan 2 considers curtailing of the inspection at the rejection stage and Plan 3 considers curtailing of the inspection at both the acceptance and rejection stages. |
| Keywords: | Time Series Analysis Stationary Time Series Moving Average Nonlinear Prediction Spectral Analysis Regression Analysis Fast Fourier Transform Spectral Windows |