Selective orientation of SrBi4Ti4O15 thin films grown on buffered Si(100) substrates

Many efforts have been paid to uncouple the spontaneous polarizations of layer-structured bismuth-based ferroelectrics along different crystal orientations, obtaining these layered-structure films with non-c-axis orientations. In the paper, SrBi₄Ti₄O₁₅ (m?=?4) thin films have been deposited on Pt/MgO bilayer-buffered Si(100) substrates by pulsed-laser deposition. Selective orientation of SrBi₄Ti₄O₁₅ thin films mediated by different epitaxy relationships between electrode layers and MgO/Si substrates has been demonstrated. Furthermore, different hysteresis loops and remnant polarization of SrBi₄Ti₄O₁₅ thin films with varied orientations have been obtained.