Scan Cell Positioning for Boosting the Compression of Fan-Out Networks |
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Authors: | Ozgur Sinanoglu Mohammed Al-Mulla Noora A Shunaiber Alex Orailoglu |
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Affiliation: | Math and Computer Science Department, Kuwait University, Safat, 13060 Kuwait
Computer Science and Engineering Department, University of California, San Diego, La Jolla, CA, 92093 U.S.A. |
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Abstract: | Ensuring a high manufacturing test quality of an integrated electronic circuit mandates the application of a large volume
test set. Even if the test data can be fit into the memory of an external tester, the consequent increase in test application
time reflects into elevated production costs. Test data compression solutions have been proposed to address the test time
and data volume problem by storing and delivering the test data in a compressed format, and subsequently by expanding the
data on-chip. In this paper, we propose a scan cell positioning methodology that accompanies a compression technique in order
to boost the compression ratio, and squash the test data even further. While we present the application of the proposed approach
in conjunction with the fan-out based decompression architecture, this approach can be extended for application along with
other compression solutions as well. The experimental results also confirm the compression enhancement of the proposed methodology. |
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