Spectroscopic,electrical and EPR studies of binary semiconducting oxide glasses containing 50 mol% V2O5期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Spectroscopic,electrical and EPR studies of binary semiconducting oxide glasses containing 50 mol% V2O5

Authors:	E E Khawaja M Sakhawat Hussain M A Khan J S Hwang

Affiliation:	(1) Physics Department, University of Petroleum and Minerals, Dhahran, Saudi Arabia;(2) Chemistry Department, University of Petroleum and Minerals, Dhahran, Saudi Arabia

Abstract:	Recent measurements on the V₂O₅-GeO₂ glass system consisting of an equimolar mixture of V₂O₅ and GeO₂ revealed that increase in electrical conductivity of these glasses upon annealing could be attributed to the increase in V⁴⁺ and V³⁺ content which accompanied the microstructure formation. In the present work we report a similar study on V₂O₅-TeO₂ and V₂O₅-P₂O₅ glass systems. It was found that in tellurite glass V³⁺ content increased upon annealing and V⁴⁺ content remained unchanged. In phosphate glass some increase in V⁴⁺ and no significant change in V³⁺ contents were observed. V³⁺ and V⁴⁺ contents in glasses could be best estimated from optical and electron paramagnetic resonance spectra, respectively.

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