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Pb/Sn凸剪切性能研究
引用本文:李倩倩,陈国海,马莒生. Pb/Sn凸剪切性能研究[J]. 电子元件与材料, 2004, 23(5): 41-42
作者姓名:李倩倩  陈国海  马莒生
作者单位:清华大学材料科学与工程系电子材料与封装技术研究室,北京,100084
摘    要:在实际使用条件下,Pb/Sn凸点会由于承受温度循环而产生剪切应力,剪切应力导致的主要失效方式是开裂.通过对倒装焊后Pb/Sn凸点剪切强度的测量及对剪切后断口的分析,发现破坏主要发生在凸点下金属(UBM)层内部或UBM与Al焊盘之间,平均剪切强度受凸点尺寸影响很小,范围在21~24MPa。

关 键 词:Pb/Sn凸点  UBM  剪切强度
文章编号:1001-2028(2004)05-0041-02

Study on Shear Strength Characters of Pb/Sn Bump
LI Qian-qian,CHEN Guo-hai,MA Ju-sheng. Study on Shear Strength Characters of Pb/Sn Bump[J]. Electronic Components & Materials, 2004, 23(5): 41-42
Authors:LI Qian-qian  CHEN Guo-hai  MA Ju-sheng
Affiliation:LI Qian-qian,CHEN Guo-hai,MA Ju-sheng Department of Materials Science and Engineering,Tsinghua University,Beijing 100084,China
Abstract:Because of excellent property and low cost, Pb/Sn bump plays a key role in chip level packaging. In practice,its shear strength is induced by temperature recycle and the main failure model is cracking. In this paper, we measured theshear strength of Pb/Sn bumps after bonding and analyzed the fracture positions by SEM. The results of the experimentindicate that most fracture happened in UBM or between UBM and Al pad, and the average shear strength is about 21~24MPa.
Keywords:Pb/Sn bump  UBM  shear strength
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