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Surface Potential Imaging of Solution Processable Acene‐Based Thin Film Transistors |
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| Authors: | Lucile C. Teague Behrang H. Hamadani Oana D. Jurchescu Sankar Subramanian John E. Anthony Thomas N. Jackson Curt A. Richter David J. Gundlach James G. Kushmerick |
| Affiliation: | 1. National Institute of Standards and Technology Gaithersburg, MD 20899 (USA);2. Present address: Savannah River National Laboratory, Aiken, SC 29808 (USA);3. Department of Electrical Engineering The Pennsylvania State University University Park, PA 16802 (USA);4. Department of Chemistry, University of Kentucky Lexington, KY 40506 (USA) |
| Abstract: | |
| Keywords: | charge transport field‐effect transistors organic scanning kelvin probe microscopy semiconductors solution processing |