| 窄脉冲半导体激光器峰值功率测试及校准方法研究 |
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| 引用本文： | 张贵军,张锐,冯凯飞.窄脉冲半导体激光器峰值功率测试及校准方法研究[J].四川激光,2009,30(1). |
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| 作者姓名： | 张贵军 张锐 冯凯飞 |
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| 作者单位： | 张贵军,ZHANG Gui-jun(中国电子科技集团公司第十三研究所,石家庄,050051);张锐,ZHANG Rui(中国电子科技集团公司第十三研究所,石家庄050051;燕山大学测试计量技术及仪器河北省重点实验室,河北秦皇岛066004);冯凯飞,FENG Kai-fei(河北省计量监督检测院,石家庄,050051)
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| 摘 要： | 提出了一种基于波形分析原理实现窄脉冲半导体激光器峰值功率测量的方法,并研究了测试系统的校准技术.此测试系统主要由数字存储示波器和光电转换装簧组成.可直接测量峰值功率.为-r保征测量准确度.根据测量电压与激光脉冲功率的比例关系,溯源争标准激光功率或能量来校准此系统.实验以波长900nm,脉宽为200us和200m的宽、窄两种脉冲半导体激光器为例,采用不同的校准方法分别对测试系统的比例系数k进行标定,并分析了测量不确定度.
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| 关 键 词： | 峰值功率 测试方法 校准 不确定度 |
Study on the methods of measurement and calibration of the peak power of the narrow pulsed semiconductor laser |
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| ZHANG Gui-jun,ZHANG Rui,FENG Kai-fei.Study on the methods of measurement and calibration of the peak power of the narrow pulsed semiconductor laser[J].Laser Journal,2009,30(1). |
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| Authors: | ZHANG Gui-jun ZHANG Rui FENG Kai-fei |
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| Affiliation: | 1.The 13th Research Institute of CETC;Shijiazhuang;Hebei 050051;China;2.Measurement Technology and Instrumentation Key Lab of Hebei Province;Yanshan University;Qinhuangdao;Hebei 066004;3.Institute of Metrological Supervision and Measurement of Hebei Province;China |
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| Abstract: | A method about narrow pulsed semiconductor laser peak power measurement based on wave analysis was advanced,then we studied the calibration technology of the system. The test system was composed of a digital storage oscilloscope and a photoelectric transform device, it can be used to measure the peak power of laser.Then using the direct proportion of voltage and the peak power,we traced to the source of standard laser power or energy in order to ensure measurement pracise.At the end,we used different method... |
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| Keywords: | peak power measurement method calibration uncertainty |
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