| 新型的嵌入式存储器测试算法 |
| |
| 引用本文： | 官枫林,习友宝.新型的嵌入式存储器测试算法[J].单片机与嵌入式系统应用,2011,11(12):1-3. |
| |
| 作者姓名： | 官枫林 习友宝 |
| |
| 作者单位： | 电子科技大学电子工程学院,成都,610000 |
| |
| 摘 要： | 针对目前嵌入式存储器测试算法的测试效率与故障覆盖率难以兼得的现状，提出了兼顾二者的测试算法。实验结果表明该算法最适合对存储器进行大批量的测试。在测试效率上的优势很明显，故障覆盖率也能达到应用标准。
|
| 关 键 词： | 存储器测试 嵌入式存储器 故障覆盖率 外围互连线 |
Improved Test Algorithms of Embedded Memory |
| |
| Guan Fenglin,Xi Youbao.Improved Test Algorithms of Embedded Memory[J].Microcontrollers & Embedded Systems,2011,11(12):1-3. |
| |
| Authors: | Guan Fenglin Xi Youbao |
| |
| Affiliation: | (School of Electronic Engineering, University of Electronic Science and Technology of China, ChengDu 610000,China) |
| |
| Abstract: | Based on the current situation that the test efficiency and fault coverage of embedded memory test are contradictory, the bal- anced test algorithms are presented. Experimental results show that the algorithms are suitable for memory test. Its advantages on test efficiency is clear. The fault coverage also meets the applicable standards. |
| |
| Keywords: | memory test embedded memory fault coverage peripheral interconnect |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
