| 数字下变频器HSP50216原理及测试模式的使用 |
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| 引用本文： | 罗亚松,高俊. 数字下变频器HSP50216原理及测试模式的使用[J]. 半导体技术, 2007, 32(2): 170-173 |
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| 作者姓名： | 罗亚松 高俊 |
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| 作者单位： | 海军工程大学,武汉,430033;海军工程大学,武汉,430033 |
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| 摘 要： | 通过对数字下变频器HSP50216内部结构、工作原理及性能特点的介绍,给出了其在下变频处理中的应用.另外,该芯片配有一个测试模式,它通常用来进行芯片检测.给出了利用测试模式来使HSP50216完成数字化激励器中基带处理功能的另外一种应用.实践证明这种方法是可行的,提高了对测试模式使用的灵活性,并以此扩展了HSP50216的功能,满足更多情况的需要.
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| 关 键 词： | 测试模式 数字下变频器 软件无线电 |
| 文章编号： | 1003-353X（2007）02-0170-04 |
| 修稿时间： | 2006-07-18 |
Principles of Digital Down Converter HSP50216 and the Use of Its Test Mode |
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| LUO Ya-song,GAO Jun. Principles of Digital Down Converter HSP50216 and the Use of Its Test Mode[J]. Semiconductor Technology, 2007, 32(2): 170-173 |
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| Authors: | LUO Ya-song GAO Jun |
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| Affiliation: | Naval University of Engineering, Wuhan 430033, China |
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| Abstract: | By discussing the inside structure, the working principle and feature of the digital down converter HSP50216 and its use in down - conversion process were given. HSP50216 had a test mode which was generally used to examine the chip. How to use the test mode to make the chip deal with the base-band signals in the digital sender was also included. This method was checked up through practices and proved to be feasible. As a result, the flexibilities of the test mode and the functions of the HSP50216 are enlarged which make HSP50216 meet more circumstances needs. |
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| Keywords: | test mode DDC software radio |
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