Low Loss Sintered Dielectric Resonators with HTS Thick Films |
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Authors: | Neil McN Afford Stuart J. Penn Alan Templeton Xiaoru Wang |
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Affiliation: | (1) South Bank University, SEI 0AA London, United Kingdom |
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Abstract: | The combination of high-Qdielectric resonators and high-temperature superconducting (HTS) films offer many advantages in the
area of cellular and satellite communications. The high cost of single crystal dielectrics and HTS thin films may be unattractive
in certain applications. Superconducting thick films and polycrystalline ceramic dielectrics offer a high performance, low-cost
alternative to high-Qthin film/single crystal dielectric resonators. The loss of polycrystalline ceramics of A12O3, Ba(Mg1/3Ta2/3)O3 (BMT), and Zr0.875 Sn0.25Ti0.875O4 (ZTS) has been studied. Alumina, A12Oin3, has been studied as a model material for dielectric loss. Theory predicts that the loss in single crystal sapphire should
follow aT
5
dependence. However, at low temperatures the loss is dominated by extrinsic losses due to crystal imperfection, residual
dopant atoms, dislocations, and other lattice defects and theT
5
dependence does not hold. In polycrystalline alumina the intrinsic loss is immediately masked by these extrinsic losses,
even at room temperature, and a simpleT dependence is observed. Results on polycrystalline alumina show that Q’s well in excess of 105 at 10 GHz and 77 K can be
achieved in a design made compact by the use of a HTS thick film shield. |
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Keywords: | Dielectric loss ceramic dielectric resonators superconducting thick films |
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