Overdrive in the ramp histogram test of ADCs |
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Authors: | Alegria FAC da Cruz Serra AM |
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Affiliation: | Inst. Superior Tecnico, Univ. Tecnica de Lisboa, Lisbon, Portugal; |
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Abstract: | This paper presents a study about the amount of overdrive to use when analog-to-digital converters (ADCs) are tested with the ramp histogram method. Overdrive is used to limit the error induced by input-equivalent noise in the estimation of the ADC transition voltages. This study has direct application in the new coarse ramp static test. |
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