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Sb掺杂SnO2/SiO2纳米光学气敏薄膜的制备及其性质
引用本文:顾铮先,梁培辉,张伟清.Sb掺杂SnO2/SiO2纳米光学气敏薄膜的制备及其性质[J].光电子.激光,2004,15(4):423-427.
作者姓名:顾铮先  梁培辉  张伟清
作者单位:1. 上海理工大学理学院光电功能薄膜实验室,上海,200093
2. 中国科学院上海光学精密机械研究所,上海,201800
基金项目:上海市教委曙光计划资助项目(02SG32);上海市教委发展基金资助项目(01F01)
摘    要:采用溶胶凝胶(sol-gel)工艺制备了Sb掺杂SnO2/SiO2复合膜。通过X射线衍射(XRD)、傅立叶变换红外谱(FT-IR)及原子力显微镜(AFM)表征了薄膜样品的物相结构与表面形貌,利用紫外-可见光谱研究了复合薄膜光学特性.利用p-偏振光双面反射法对薄膜的气敏特性进行了测试。实验结果表明,薄膜中的晶粒具有纳米尺寸(~35nm)的大小.比表面积大,孔隙率高;薄膜的透光率高,可见光波段近95%;纳米Sb:SnO2:SiO2复合膜的气敏灵敏度高于纯SnO2薄膜及Sb掺杂的SnO2薄膜。

关 键 词:SnO2纳米薄膜  Sol-gel技术  溶胶凝胶工艺  光学气敏薄膜  Sb掺杂SnO2/SiO2复合膜  光学参数  气敏特性
文章编号:1005-0086(2004)04-0423-05

Characteristics and Preparation of Nanometer-sized Sb-doped SnO2/SiO2 Optical Gas-sensing Thin Films
GU Zheng-xian.Characteristics and Preparation of Nanometer-sized Sb-doped SnO2/SiO2 Optical Gas-sensing Thin Films[J].Journal of Optoelectronics·laser,2004,15(4):423-427.
Authors:GU Zheng-xian
Affiliation:GU Zheng-xian~
Abstract:Sb-doped SnO_2/SiO_2 nano-composition thin films were prepared by sol-gel method.The crystal structure and surface topograph of the thin films were characterized by X-ray diffraction(XRD),Fourier transform infrared spectroscopy(FT-IR) and atomic force microscopy(AFM).The optical properties of the thin films were studied by UV-VIS spectra.The gas-sensing property was tested by p-polarized reflectance.The experimental results show that,the crystalline grain size is about 34 nm,the specific surface area is large,and the duty porosity is high;the optical transmissivity is higher,near 95 % in visible spectrum range.Further,the gas sensitivity of Sb:SnO_2/SiO_2 nano-composition thin films is higher than one of Sb:SnO_2 thin films.
Keywords:sol-gel method  nano-thin film  optical parameter  gas-sensing property
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