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RF MEMS开关失效因素的COMSOL仿真
引用本文:张海明,杨圣. RF MEMS开关失效因素的COMSOL仿真[J]. 微电子学, 2008, 38(2): 157-161
作者姓名:张海明  杨圣
作者单位:中国科学技术大学,精密机械与精密仪器系,合肥,230027
摘    要:针对RF MEMS开关的可靠性问题,利用有限元软件COMSOL,对悬臂式RF MEMS开关周围的电场分布,开关上的电荷分布和本征频率进行了分析;并研究了在静电场和结构力场耦合作用下悬臂梁的内应力情况,找出开关损坏的可能部位,探索RF MEMS失效的机理,为悬臂式RF MEMS开关的优化改进提供理论依据。

关 键 词:RFMEMS开关  有限元  耦合场  本征频率  内应力
文章编号:1004-3365(2008)02-0157-04
修稿时间:2007-07-17

COMSOL Simulation of Failure Mechanisms of RF MEMS Switch
ZHANG Haiming,YANG Sheng. COMSOL Simulation of Failure Mechanisms of RF MEMS Switch[J]. Microelectronics, 2008, 38(2): 157-161
Authors:ZHANG Haiming  YANG Sheng
Abstract:To investigate the reliability problem of RF MEMS switches,the influence of electric field and frequency characteristics on the structure of RF MEMS switch was considered.The cantilevered RF MEMS switch was simulated using finite element analysis software COMSOL.The electric field around the cantilever and the surface charge density of the switch were analyzed,and the internal stress of the cantilever under the action of static field coupled with structural force field was investigated.To optimize the RF MEMS switch,possible locations of damage on the switch was identified and failure mechanisms of the RF MEMS switch was discussed.
Keywords:RF MEMS switch  Finite element  Coupling field  Intrinsic frequency  Internal stress
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