晶体材料内部残余应力衍射法无损检测的研究进展

目前能够准确、无损地测试材料内部残余应力的手段主要是中子衍射和同步辐射,但这两种测试手段需要核反应堆或高能同步辐射源,投资巨大,只为少数发达国家的少数实验室所拥有,难以应用到实际生产中。短波长X射线衍射仪通过钨靶-K_α特征射线(波长约0.02 nm)以及独特的谱接收方式,达到或接近同步辐射及中子衍射对晶体材料内部晶格应变的无损定点测试,为内部残余应力无损检测的广泛应用开辟了一条新的渠道。介绍了中子衍射和同步辐射对残余应力测试的国内外研究现状,重点展示了短波长X射线衍射仪用于内部应力测试的结果,并就三种测试方法特点进行了对比分析。

Advance of Non-destructive Diffraction Measuring Internal Residual Stress in Crystal Materials

Neutron diffraction and synchrotron radiation are the main methods for non-destructive measuring internal residual stress existed in crystal materials at present.However,the facilities used by these methods need huge investment as they require nuclear reactor or high energy synchrotron source,only several laboratories in few developed countries owned the diffraction spectrum-meter.The wide application in industries is restricted critically. Short-wavelength X-ray diffraction（SWXRD）,exploiting the W-target-K{αray（wavelength of about 0.02 nm） and distinctive spectrum receive mode,achieves a high penetration depth and accurately measure the lattice strain with non-destructive method like neutron diffraction and synchrotron radiation.It is a new practical way to measure internal residual stress non-destructively.The advances of measuring residual stress by neutron diffraction and synchrotron radiation at home and abroad were reviewed.The test results of internal residual stress gained by shortwavelength X-ray diffractometer were revealed.The three kinds of diffraction methods of measuring internal stress non-destructively were compared and analyzed.