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Approximate estimation of system reliability via fault trees
Authors:Y. Dutuit  A. Rauzy  
Affiliation:a LAP-ADS, IUT, Université Bordeaux 1, 33405, Talence Cedex, France;b IML/CNRS, 169, avenue de Luminy, 13288, Marseille Cedex 9, France
Abstract:
In this article, we show how fault tree analysis, carried out by means of binary decision diagrams (BDD), is able to approximate reliability of systems made of independent repairable components with a good accuracy and a good efficiency. We consider four algorithms: the Murchland lower bound, the Barlow-Proschan lower bound, the Vesely full approximation and the Vesely asymptotic approximation. For each of these algorithms, we consider an implementation based on the classical minimal cut sets/rare events approach and another one relying on the BDD technology. We present numerical results obtained with both approaches on various examples.
Keywords:System reliability   Fault tree   Binary decision diagrams
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