Fatigue crack initiation and growth in solder alloys

In modern electronic packaging, especially surface mount technology (SMT), thermal strain is usually induced between components during processing, and in service, by a mismatch in the thermal expansion coefficients. Since solder has a low melting temperature and is softer than other components in electronic packaging, most of the cyclic stresses and strains take place in the solder. Fatigue crack initiation and fatigue crack propagation are likely to occur in the solder even when the cyclic stress is below the yield stress. It is an objective of this research to study the behaviour of fatigue crack initiation and propagation in both lead‐containing solder (63Sn‐37Pb), and lead‐free solders (Sn‐3.5Ag). The effect of alloying (Cu and Bi addition), frequency, tensile hold time and temperature on low cycle fatigue (LCF) behaviour of the solders is discussed. Mechanisms of LCF crack initiation and propagation are proposed and LCF life prediction, based on the various models, is carried out.