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Dependence of the structural and the electrical properties on the Hg/Te flux-rate ratios for Hg0.7Cd0.3Te epilayers grown on CdTe buffer layers |
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| Authors: | Y S Ryu B S Song T W Kang T W Kim |
| Affiliation: | (1) Department of Physics and Quantum-functional Semiconductor Research Center, Dongguk University, 3-26 Pildong, Chungku, Seoul, 100-715, Korea;(2) Advanced Semiconductor Research Center, Division of Electrical and Computer Engineering, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul, 133-791, Korea |
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