X射线荧光分析中原级谱分布的计算

X射线荧光分析中,X射线管产生的原级谱的分布对荧光分析的影响很大。尤其是在元素间吸收增强效应的校正过程中,基本参数法要求准确获得X射线原级谱的强度分布。使用MCNP程序模拟不同加速电压、不同靶材料、不同铍窗厚度等条件下电子打靶后的X射线能谱分布,为X射线荧光分析仪研制过程优化X光管靶材、管压等提供依据,实现高精度的X射线荧光分析。

The Calculation of Primary Energy Spectrum Distribution in X-ray Fluorescence Analysis

The primary spectrum of X-ray tube has great influence on the X-ray fluorescence (XRF) analysis. During the correction of the absorption and enhancement effect, the fundamental parameter method requires the accurate primary spectrum of of X-ray tube. The X-ray spectrum after electron hitting target was calculated using the MCNP program, with different X-ray tube voltages, different target materials and different beryllium window thickness; The obtained spectroscopy data can reflect the spectrum characteristics under different conditions, and may be used for optimization of target material, high voltage and so on, to realize high accurate XRF analysis.