|
|||||
|
|
Density of states measurements in a-Si:H and a-Si:H/nc-Si:H multilayer structures prepared by hot wire chemical vapor deposition |
|
| Affiliation: | 1. STMicroelectronics, Crolles, France;2. CEA-LETI, Grenoble, France;3. IMEP-LAHC, Université Grenoble Alpes, Grenoble, France |
| Abstract: | |
| Keywords: | a‐Si:H/nc‐Si:H multilayer structure Density of states Hot wire chemical vapor deposition Persistent photoconductivity Space-charge limited current |
| 本文献已被 ScienceDirect 等数据库收录！ | |