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微电子封装无铅焊点的可靠性研究进展及评述
引用本文:方园,符永高,王玲,王鹏程,周洁.微电子封装无铅焊点的可靠性研究进展及评述[J].电子工艺技术,2010,31(2):72-76.
作者姓名:方园  符永高  王玲  王鹏程  周洁
作者单位:广州电器科学研究院广东省日用电器公共实验室,广东,广州,510300
摘    要:在电子电器产品的无铅化进程中,由于封装材料与封装工艺的改变,焊点的可靠性已成为日益突出的问题。着重从无铅焊点可靠性的影响因素、典型的可靠性问题及无铅焊点可靠性的评价3个方面阐述了近年来该领域的研究状况,进而指出无铅化与可靠性研究需注意的问题和方向。

关 键 词:电子封装  无铅  焊点可靠性  

Progress and Review on Lead-free Solder Joint Reliability in Micro-electronic Packaging
FANG Yuan,FU Yong-gao,WANG Ling,WANG Peng-cheng,ZHOU Jie.Progress and Review on Lead-free Solder Joint Reliability in Micro-electronic Packaging[J].Electronics Process Technology,2010,31(2):72-76.
Authors:FANG Yuan  FU Yong-gao  WANG Ling  WANG Peng-cheng  ZHOU Jie
Affiliation:Guangdong Province Open Lab for Household Electrical Appliances;Guangzhou Electric Apparatus Research Institute;Guangzhou 510300;China
Abstract:In the lead-free process of electrical and electronic equipment,solder joint reliability has become the increasingly outstanding problem because of the change of material and technology in electronic packaging.Three aspects,influencing factors on lead-free solder joint reliability,typical reliability problems and lead-free solder joint reliability evaluation are elaborated emphatically in detail,in order to demonstrate issues and tendency on lead-free and research on solder joint reliability.
Keywords:Electronic packaging  Lead-free  Solder joint reliability  
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