In situ measurement of water at the organic coating/substrate interface

In situ and quantitative information on the water layer at the organic coating/substrate interface is crucial for understanding and preventing the failure of organic coating systems. A technique, based on a two-layer model derived rigorously from internal reflection theory, has been developed for measuring in situ the thickness and amount of the water layer at the organic coating/substrate interface. The technique gives new insight into the processes by which water degrades the coating/substrate bonds. In this technique, a transparent or an opaque organic coating of sufficient thickness is applied to an internal reflection element (IRE) with or without a thin metallic film, which is used as the substrate. A water chamber is attached to the organic-coated specimen. After adding water to the chamber, Fourier transform infrared-multiple internal reflection (FTIR-MIR) spectra are taken automatically at specified time intervals without disturbing the specimens or the instrument. Water uptake in the coating and FTIR-MIR spectra of water on the coating-free substrate are also used for the analysis. Examples of clear and pigmented coatings on untreated and treated substrate surfaces are given to demonstrate the technique. Results of water accumulation at the coating/iron interface with and without applied electrical potentials are given. In addition to measuring water at the coating/substrate interface, the technique provides a means for studying the transport of water through a coating adhered to a substrate. Information on water at the interface and its transport properties through coatings applied to a substrate is valuable for interpreting corrosion, blistering and delamination of organic coating systems, and for developing models for use in predicting the serivce lives of protective coatings.