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Strain mapping accuracy improvement using super‐resolution techniques |
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| Authors: | G BÁRCENA‐GONZÁLEZ MP GUERRERO‐LEBRERO E GUERRERO D FERNÁNDEZ‐REYES D GONZÁLEZ A MAYORAL AD UTRILLA JM ULLOA PL GALINDO |
| Affiliation: | 1. Department of Computer Science and Engineering, University of Cádiz, Cádiz, Spain;2. Department of Material Science and Metallurgy Engineering and Inorganic Chemistry, University of Cádiz, Cádiz, Spain;3. Institute of Nanoscience of Aragon and Laboratory of Advanced Microscopies, University of Zaragoza, Zaragoza, Spain;4. Institute for Systems based on Optoelectronics and Microtechnology (ISOM), Universidad Politecnica de Madrid, Madrid, Spain |
| Abstract: | Super‐resolution (SR) software‐based techniques aim at generating a final image by combining several noisy frames with lower resolution from the same scene. A comparative study on high‐resolution high‐angle annular dark field images of InAs/GaAs QDs has been carried out in order to evaluate the performance of the SR technique. The obtained SR images present enhanced resolution and higher signal‐to‐noise (SNR) ratio and sharpness regarding the experimental images. In addition, SR is also applied in the field of strain analysis using digital image processing applications such as geometrical phase analysis and peak pairs analysis. The precision of the strain mappings can be improved when SR methodologies are applied to experimental images. |
| Keywords: | High‐resolution high‐angular annular dark field image reconstruction strain analysis |