| 提高DIP测试插座装夹方式的可靠性研究 |
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| 引用本文： | 张冉,叶新艳.提高DIP测试插座装夹方式的可靠性研究[J].电子测试,2016(7). |
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| 作者姓名： | 张冉 叶新艳 |
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| 作者单位： | 中航工业西安航空计算技术研究所，陕西西安，710065 |
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| 摘 要： | 为了解决检测单位对于多品种、大批量DIP集成电路在测试时，测试插座导电弹片与器件管脚接触的可靠性问题，本文通过对老炼测试插座的分析，结合其在实际使用中的问题，提出了一种新型插座结构。
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| 关 键 词： | DIP 测试 插座 可靠性 |
Reliability research on the way of improving DIP test socket |
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| Abstract: | In orderto solve the detection unit for many varieties,large quantities of dip integrated circuit in the test,the test socket conductive shrapnel and device pipe foot is in contact with the reliability problems.In this paper,through the analysis of burn-in test socket,combined with its problems in the practical use,a new socket structure is proposed. |
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| Keywords: | DIP test socket reliability |
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