首页 | 本学科首页   官方微博 | 高级检索  
     


EM and substrate coupling in silicon RFICs
Authors:Amaya   R. Popplewell   P.H.R. Cloutier   M. Plett   C.
Affiliation:Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada;
Abstract:
An investigation of coupling between inductors and resonators fabricated in silicon substrates is presented and the effects on RF systems and components are discussed. A novel experimental technique to measure inductor and resonator coupling is presented. The experiment is extremely sensitive, fast, accurate, and unique in that no matching, probe de-embedding, or calibration is necessary as the ratio of two on-chip signals is measured to yield the results.
Keywords:
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号