| 电子显微镜在金属-半导体纳米线界面原位合金化中的应用 |
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| 引用本文： | 王岩国. 电子显微镜在金属-半导体纳米线界面原位合金化中的应用[J]. 分析仪器, 2012, 5(5): 23-27. DOI: 10.3969/j.issn.1001-232X.2012.05.006 |
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| 作者姓名： | 王岩国 |
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| 作者单位： | 中国科学院物理研究所,北京,100190 |
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| 基金项目： | 国家自然科学基金资助课题（项目批准号60796078,10774174） |
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| 摘 要： | 利用原位电子显微方法研究了金属-ZnSe半导体纳米线界面合金化过程,结果表明:在脉冲电流的作用下,ZnSe纳米线可以产生明显的焦耳热效应,导致金属-ZnSe纳米线界面发生合金化反应.通过调整纳米线与金属电极的接触面积,可将焦耳热效应准确控制在界面内,进而实现纳米尺度的合金化反应.
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| 关 键 词： | 电子显微镜 原位合金化 金属-半导体界面 |
Application of electron microscope in situ alloying at metal-semiconductor contact. |
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| Wang Yan-guo. Application of electron microscope in situ alloying at metal-semiconductor contact.[J]. Analytical Instrumentation, 2012, 5(5): 23-27. DOI: 10.3969/j.issn.1001-232X.2012.05.006 |
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| Authors: | Wang Yan-guo |
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| Affiliation: | Wang Yan-guo (Institute of Physics, Chinese Academy of Sciences, Beijing 100190,China) |
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| Abstract: | In situ alloying at metal-ZnSe nanowire interface has been studied by means of transmission electron microscopy. The results show interracial reaction initialized by Joule heat produced by pulse electron current flowing through the metal-ZnSe nanowire contact. The alloying can be controlled at nanoscale by adjusting the contact area between the metal electrode and the nanowire. |
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| Keywords: | electron microscope in situ alloying metal-semiconductor contact |
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