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Measuring the complexity of product line architecture with vADL |
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| Authors: | ZHANG Tao CAO Yan-ping ZHANG Chang-li MA Chun-yan |
| Affiliation: | School of Software and Microelectronics, Northwestern Polytechnical University, Xi＇an 710072, China; 2. School of Science, Xi＇an University of Architecture and Technology, Xi＇an 710055, China) |
| Abstract: | product line architecture software metrics complexity architecture description language variability |
| Keywords: | product line architecture software metrics complexity architecture description language variability |
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