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扫描电子显微镜下单壁碳纳米管的原位操控与性能
引用本文:董幼青,张礼杰,邹超,黄少铭. 扫描电子显微镜下单壁碳纳米管的原位操控与性能[J]. 材料科学与工程学报, 2009, 0(5)
作者姓名:董幼青  张礼杰  邹超  黄少铭
作者单位:温州大学纳米材料与化学重点实验室;
基金项目:国家自然科学基金资助项目(50772076)
摘    要:本文利用纳米操纵仪结合扫描电子显微镜系统对单壁碳纳米管进行在线操纵,在此基础上,通过外接的半导体参数测量系统,可以测量单壁碳纳米管的电学性能。此外,通过纳米操纵手对碳纳米管施加外电场,还可以改变二氧化硅表面单壁碳纳米管的扫描电子显微镜成像。

关 键 词:纳米操纵仪  扫描电子显微镜  单壁碳纳米管  原位测量  纳米操纵  

In situ Study on Properties of Single-Walled Carbon Nanotubes by the Nano-Manipulator in a Scanning Electron Microscope
DONG You-qing,ZHANG Li-jie,ZOU Chao,HUANG Shao-ming. In situ Study on Properties of Single-Walled Carbon Nanotubes by the Nano-Manipulator in a Scanning Electron Microscope[J]. Journal of Materials Science and Engineering, 2009, 0(5)
Authors:DONG You-qing  ZHANG Li-jie  ZOU Chao  HUANG Shao-ming
Affiliation:DONG You-qing,ZHANG Li-jie,ZOU Chao,HUANG Shao-ming(Nanomaterials & Chemistry Key Laboratory of Wenzhou University,Wenzhou 325027,China)
Abstract:Manipulation of single walled carbon nanotubes(SWNTs) by a nano-manipulator attached to a scanning electron microscope(SEM) and in situ measurement of SWNT-based field effect transistor(FET) have been demonstrated.It was also observed that the imaging of SWNT on SiO_2 substrate can be affected by the voltage applied on the substrate through the nano-manipulator.
Keywords:nano-manipulator  SEM  SWNTs  in situ measurement  nano-manipulation  
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