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AlGaN/GaN HFET的优化设计
引用本文:薛舫时.AlGaN/GaN HFET的优化设计[J].固体电子学研究与进展,2007,27(2):163-169.
作者姓名:薛舫时
作者单位:单片集成电路与模块国家级重点实验室,南京电子器件研究所,南京,210016
摘    要:从自洽求解薛定谔方程和泊松方程出发研究了不同掺杂方式下异质结能带和二维电子气的行为。发现掺杂能剪裁异质结能带的弯曲度、控制电子气的二维特性和浓度。在此基础上研究了不同掺杂方式的掺杂效率。通过掺杂和势垒结构的优化设计,得出了用δ掺杂加薄AlN隔离层的结构,既提高了电子气浓度,又保持电子气的强二维特性。从电子气浓度和栅对电子气的控制力度出发,提出了HFET势垒优化设计中的电子气浓度与势垒层厚度乘积规则。依据二维表面态理论,研究了表面态随帽层掺杂结构的变化。从前述乘积规则和表面态变化出发进行了内、外沟道异质结构的优化设计。优化结构既提高了电子气浓度和跨导,降低了欧姆接触电阻,又抑制了电流崩塌。

关 键 词:铝镓氮/氮化镓异质结场效应管  优化设计  势垒层掺杂效率  电子气浓度与势垒层厚度乘积  表面态  无电流崩塌设计
文章编号:1000-3819(2007)02-163-07
修稿时间:2005年7月12日

Optimized Design of AlGaN/GaN HFET
XUE Fangshi.Optimized Design of AlGaN/GaN HFET[J].Research & Progress of Solid State Electronics,2007,27(2):163-169.
Authors:XUE Fangshi
Abstract:From self-consistent solution of Schro dinger equation and Poisson equation the band structure and the behavior of two-dimensional electron gases for AlGaN/GaN heterostructures with different doping structure are investigated.It is found that the band structure winding and two-dimensional electron gases are controlled by the doping structures,from which the doping efficiency for different doping models is compared.By using the optimized design of doping and heterostructures,a heterostructure with δ doping and thin AlN exclusion layer is proposed,which not only increases the electron density but also strengthens the two-dimensional degree of electron.Considering the controllability of two-dimensional electrons during the RF operation of HFET,a product of electron density and barrier width is proposed as a criterion for heterostructure design.Based on the two-dimensional surface state theory the surface states under different doping concentration in surfacing layer are calculated.According to the criterion of heterostructures design and two-dimensional surface state behaviors an optimized heterostructure design for current-collapse-free HFET is given.
Keywords:AlGaN/GaN HFET  optimized design  doping efficiency in barrier  a product of electron density and barrier width  surface states  heterostructure design for current-collapse-free HFET
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