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| 发光二极管开路失效分析 | |
| 引用本文： | 蔡伟智. 发光二极管开路失效分析[J]. 电子质量, 2008, 0(6): 62-64 |
| 作者姓名： | 蔡伟智 |
| 作者单位： | 厦门三安电子有限公司,福建厦门,361009 |
| 摘 要： | 本文简述了发光二极管结构原理,对发光二极管开路失效模式进行全面分析,确定不同的失效机理及所对应的失效原因,并提出针对性的改善措施和筛选方法,达到提高发光二极管质量和可靠性的目的。 |
| 关 键 词： | 发光二极管 开路 失效模式 失效机理 |
Failure Analysis on the Open Circuit for Light Emitting Diode |
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| Cai Wei-zhi. Failure Analysis on the Open Circuit for Light Emitting Diode[J]. Electronics Quality, 2008, 0(6): 62-64 | |
| Authors: | Cai Wei-zhi |
| Abstract: | This article briefly expounds the structure of LED, analyzing the failure mode of open circuit comprehensively, confirming different failure mechanisms as well as failure reasons respectively. Besides, it puts forward amend measures and riddling methods, which can hit the target of improving the LED's quality and security. |
| Keywords: | Light Emitting Diode(LED) Open Circuit Failure Mode Failure Mechanism |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ | |