| Abstract: | This article gives a survey of the actual experience with the relatively new technique of photo-emission electron microscopy. After describing the principal technique and the features of a modern high resolution instrument, the questions of image generation, contrast formation and resolution are considered. In particular the influence of the depth of information on resolution for flat polished sections is studied and some comparisons with the scanning electron microscope (SEM) are made.* The different fields of application of the photo-EEM are shown by examples. |
