Tailored microstructure of zirconia and hafnia-based thermal barrier coatings with low thermal conductivity and high hemispherical reflectance by EB-PVD |
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Authors: | J. Singh D. E. Wolfe R. A. Miller J. I. Eldridge Dong-Ming Zhu |
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Affiliation: | (1) Applied Research Laboratory, Penn State University, University Park, PA 16801, USA;(2) NASA-GRC, 21000 Brookpark Road, Cleveland, OH 44135, USA |
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Abstract: | ![]() Zirconia and hafnia based thermal barrier coating materials were produced by industrial prototype electron beam-physical vapor deposition (EB-PVD). Columnar microstructure of the thermal barrier coatings were modified with controlled microporosity and diffuse sub-interfaces resulting in lower thermal conductivity (20–30% depending up on microporosity volume fraction), higher thermal reflectance (15–20%) and more strain tolerance as compared with standard thermal barrier coatings (TBC). The novel processed coating systems were examined by various techniques including scanning electron microscopy (SEM), X-ray diffraction, thermal conductivity by laser technique, and hemispherical reflectance. |
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