Simulation and Measurement of Shot Noise in Resonant Tunneling Structures

We present numerical simulations and measurements of shot noise in resonant tunneling structures. We show that when electron-electron interaction through Coulomb force and Pauli exclusion is properly taken into account, the main features of noise behavior of such devices can be correctly predicted. Electron-electron interaction is shown to be responsible for the suppression of shot noise in the positive differential resistance region of the I-V curve, and for the enhancement of shot noise in the negative differential resistance region.