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Improved DSPI configuration for the inspection of components in the production line
Authors:T. W. Ng
Affiliation:(1) Department of Mechanical and Production Engineering, National University of Singapore, 10 Kent Ridge Crescent, 0511, Singapore
Abstract:
In this paper, a digital speckle pattern interferometer configuration for the enhanced nondestructive inspection of components in the production line is presented. The setup used is adapted from the original design employed for digital speckle shearing interferometry. The theoretical principle behind the technique is outlined and its application in the detection of poor bolting in plates is demonstrated.
Keywords:Digital speckle pattern interferometry  nondestructive inspection  digital speckle shearing interferometry
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