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The scanning micro-sclerometer: a new method for scratch hardness mapping
Authors:Peter J. Blau  Warren C. Oliver  Lance Snead
Affiliation:Metals and Ceramics Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831-6063, USA;Nano Instruments Inc., Knoxville, IN 37914, USA;Rensseloer Polytechnic Institute, Troy,IN 12181, USA
Abstract:A new surface engineering research tool, called a scanning microsclerometer (SMS), has been developed. It uses nano-indentation technology and a piezoelectric transducer positioning system to generate high-precision scratch patterns on the surfaces of metals and, by monitoring the instantaneous displacement of the stylus tip, can generate scratch hardness and scratching force maps of the surface. A dual-stroke process is used. The first stroke at low load profiles the surface to establish a reference datum and the second pass, in the opposite direction and at higher load, produces the indentation scratch. Examples of micro-scratch hardness mapping experiments, using scratch spacings of 1·0 μm, on a silicon carbide-based ceramic composite are used to illustrate the capabilities of the SIVIS. Using end-on fibers in the rectangular stylus scanning area, the difference in scratch hardnesses of the fibers, the matrix, and even the thin carbon coatings in the fiber-matrix interface could be detected. The SMS was originally developed to produce scratch hardness maps, but it is also useful for conducting accurately controlled, single-point micro-machining patterns and in studies of differential material abrasion.
Keywords:scratch testing   nanoindentation   microscratch   silicon carbide composite   micro-machining
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