Temporal characteristic analysis of single event effects in pulse width modulator |
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| Authors: | Wen Zhao Xiao-Qiang Guo Wei Chen Zu-Jun Wang Hong-Xia Guo Yuan-Ming Wang |
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| Affiliation: | 1. School of Nuclear Science and Technology, Xi'an Jiaotong University, Xi'an 710049, China;State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology,Xi'an 710024, China;2. State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology,Xi'an 710024, China |
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| Abstract: | In this paper,the nature and origin of single event effects (SEE) are studied by injecting laser pulses into different circuit blocks,combining with analysis to map pulse width modulators circuitry in the microchip die.A time-domain error-identification method is used in the temporal characteristic analysis of SEE.SEE signatures of different injection times are compared.More serious SEE are observed when the laser shot occurs on a rising edge of the device output for blocks of the error amplifier,current sense comparator,and T and SR latches. |
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| Keywords: | Single event effect (SEE) Laser testing Pulse width modulator |
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