MCM Test Strategy Synthesis from Chip Test and Board Test Approaches

Chip test practices such as functional test and Bist, and their relevance to MCM testing are summarized. Drawbacks of using these techniques, for some MCMs, are presented.Board test practices such as in-circuit test andboundary-scan, are summarized; the advantages of incorporating boardtest techniques for certain MCMs are given. Test strategies arecategorized and compared. Appropriate MCM test equipment isdiscussed. Examples of using chip, board, and hybrid test approachesare then given.