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Influence of capping layer thickness on the polarization of photoluminescence of CdSe/ZnSe quantum dots grown by metalorganic chemical vapor phase deposition
Authors:X B Zhang  S K Hark
Affiliation:(1) Department of Physics, The Chinese University of Hong Kong, Shatin, Hong Kong
Abstract:The polarization of the photoluminescence (PL) of self-assembled CdSe quantum dots (QDs), grown by metalorganic chemical vapor phase deposition, was measured. From the (001) surface, the PL was found preferentially polarized in the 
$$1\bar 10]$$
direction, while from the 
$$(1\bar 10)$$
cleaved surface in the 001] direction. The polarization of PL depends strongly on the ZnSe capping layer thickness and the PL energy. With an increase in ZnSe coverage, the intensity ratio 
$$I1\bar 10]/I_{110]} $$
was found to increase first, then decrease after the coverage is thicker than a critical value. Moreover, such a critical thickness is smaller for larger QDs (lower PL energies). Possible origins of the PL polarization are discussed. We suggest that besides the quantum confinement effects, the strain field in the QDs also plays an essential role in the observed polarization of PL.
Keywords:Polarization  photoluminescence  CdSe quantum dots  capping layer thickness  MOCVD
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