真空绝缘闪络的电子触发极化松弛理论

从实验依据、电荷陷阱化过程、电介质充电机理、空间电荷稳定性被破坏以及沿面闪络发生等多角度系统地论述了基于极化能量释放导致沿面闪络的新假说 ,即电子触发极化松弛理论 (ETPR)。根据ETPR分析得出 :电压性能优良的介质应包含尽量少的极化子陷阱 ,以减小空间电荷 (正负电荷 )的密度。小结了该假说的局限性即无法对真空绝缘体承受高压后能在几ns内发生闪络这一物理现象作出合理解释。

Electron Triggered Polarization Relaxation Theory for Flashover of Insulators in Vacuum

The electron triggered polarization relaxation theory (ETPR), postulated by Blaise and Gresus, is summarized from several aspects, such as experimental evidence, traps related to dielectric medium, mechanism of electron charging of dielectric, destabilization of the space charge, initiation of the surface breakdown and so on, Based on ETPR, the specification of a good dielectric material is formulated and a conclusion is give: a good dielectric is one which contains the smallest number of polaron traps, so as to reduce the density of the space charge (positive or negative). The limitation of ETPR is discussed, it can't give an explanation for the cases of flashover with ns pulses.